Technical Facilities

On-wafer S-parameters & noise parameters measurement techniques:

• HP 8510C 2-port Network Analyzer (10 MHz-50Ghz) + HP85106D waveguide extension (50-75 GHz)
• Agilent 4-port PNA-X Network Analyzer (10 MHz-50 GHz)
• Cascade-Microtech Summit 9000 wafer-probe station
• Calibration algorithms: OSLT, TRL, LRM, LRRM
• Noise factor meter HP8970B + extension HP8971C to 26 GHz
• Block down-converters for noise measurement: Miteq LNB-2642-50 (26-40 GHz), Millitech CDA-22-RC066A (33-50 GHz) and Millitech CDA-15-RC545B (50-75 GHz)

Spectrum analyzer Agilent PSA E4448A (3 Hz – 50 GHz)

Vector signal generator Agilent ESG E4438C (250 KHz – 6 GHz)

7265 DSP Lock In amplifier

HP digital signal analyzer (1-1kHz)

Vacuum chamber

Microvision system

CAD:

• Agilent ADS/Momentum/EMDS
• Coventor CoventorWare
• Cascade-Microtech WinCal XE high frequency measurement calibration software
• Own software: on-wafer calibration, small signal/noise modeling, electromagnetic methods
• ANSYS multiphysics
• L-edit

Fabrication facilities:

• Wedge wire-bonding microsoldering machines
• SMD and chip pick-and-place and die-bonding machine
• Microwave Integrated Circuit Mounting, photolithography and chemical etching
• Precision Mechanical Workshop